tests 100

100

Took 9 hr 55 min

All Tests

Name	Age	Duration
test_closest_source_point_adaptation_1	0	28 sec
test_closest_source_point_adaptation_1	0	35 sec
test_closest_source_point_adaptation_2	0	21 sec
test_closest_source_point_adaptation_2	0	16 sec
test_closest_source_point_adaptation_3	0	6.3 sec
test_closest_source_point_adaptation_3	0	8.3 sec
test_closest_source_point_adaptation_6	0	4.2 sec
test_closest_source_point_adaptation_6	0	6.4 sec
test_connected_components_1	0	1 hr 0 min
test_connected_components_1	0	45 min
test_connected_components_2	0	39 min
test_connected_components_2	0	31 min
test_data_assimilator_1	0	4.9 sec
test_data_assimilator_1	0	1.6 sec
test_ensemble_management_1	0	3.8 sec
test_ensemble_management_1	0	1 sec
test_ensemble_management_2	0	8.5 sec
test_ensemble_management_2	0	0.75 sec
test_experimental_data_1	0	1 min 45 sec
test_experimental_data_1	0	1 min 30 sec
test_geometry_1	0	1.3 sec
test_geometry_1	0	5.5 sec
test_heat_source_1	0	5.4 sec
test_heat_source_1	0	0.86 sec
test_integration_2d_1	0	23 sec
test_integration_2d_1	0	53 sec
test_integration_2d_2	0	32 sec
test_integration_2d_2	0	11 sec
test_integration_2d_device_1	0	9.3 sec
test_integration_2d_device_1	0	15 sec
test_integration_2d_device_2	0	4.7 sec
test_integration_2d_device_2	0	15 sec
test_integration_3d_1	0	22 min
test_integration_3d_1	0	39 min
test_integration_3d_2	0	36 min
test_integration_3d_2	0	55 min
test_integration_3d_amr_1	0	8 min 49 sec
test_integration_3d_amr_1	0	5 min 31 sec
test_integration_3d_amr_2	0	3 min 26 sec
test_integration_3d_amr_2	0	1 min 57 sec
test_integration_3d_amr_device_1	0	7 min 16 sec
test_integration_3d_amr_device_1	0	5 min 31 sec
test_integration_3d_amr_device_2	0	1 min 42 sec
test_integration_3d_amr_device_2	0	2 min 33 sec
test_integration_3d_device_1	0	36 min
test_integration_3d_device_1	0	28 min
test_integration_da_1	0	5 min 2 sec
test_integration_da_1	0	3 min 1 sec
test_integration_da_2	0	4 min 26 sec
test_integration_da_2	0	2 min 41 sec
test_integration_da_3	0	44 sec
test_integration_da_3	0	1 min 9 sec
test_integration_da_6	0	1 min 5 sec
test_integration_da_6	0	41 sec
test_integration_da_augmented_1	0	3 min 27 sec
test_integration_da_augmented_1	0	1 min 47 sec
test_integration_da_augmented_2	0	38 sec
test_integration_da_augmented_2	0	1 min 28 sec
test_integration_thermoelastic_1	0	26 min
test_integration_thermoelastic_1	0	40 min
test_integration_thermoelastic_2	0	11 min
test_integration_thermoelastic_2	0	18 min
test_material_deposition_1	0	30 sec
test_material_deposition_1	0	52 sec
test_material_deposition_2	0	26 sec
test_material_deposition_2	0	12 sec
test_material_property_1	0	3.8 sec
test_material_property_1	0	1.2 sec
test_material_property_device_1	0	1.2 sec
test_material_property_device_1	0	3.8 sec
test_mechanical_operator_1	0	50 sec
test_mechanical_operator_1	0	1 min 11 sec
test_mechanical_physics_1	0	2 min 57 sec
test_mechanical_physics_1	0	4 min 13 sec
test_microstructure_1	0	3.7 sec
test_microstructure_1	0	1.4 sec
test_microstructure_2	0	1 sec
test_microstructure_2	0	12 sec
test_post_processor_1	0	23 sec
test_post_processor_1	0	12 sec
test_quaternion_1	0	1 sec
test_quaternion_1	0	6.2 sec
test_scan_path_1	0	1.1 sec
test_scan_path_1	0	4.4 sec
test_thermal_operator_1	0	14 sec
test_thermal_operator_1	0	29 sec
test_thermal_operator_device_1	0	8.9 sec
test_thermal_operator_device_1	0	6.7 sec
test_thermal_physics_1	0	4 min 31 sec
test_thermal_physics_1	0	2 min 8 sec
test_thermal_physics_2	0	2 min 16 sec
test_thermal_physics_2	0	1 min 22 sec
test_thermal_physics_device_1	0	1 min 49 sec
test_thermal_physics_device_1	0	2 min 44 sec
test_timer_1	0	4.4 sec
test_timer_1	0	1.7 sec
test_utils_1	0	3.9 sec
test_utils_1	0	1.1 sec
test_validate_input_database_1	0	3.5 sec
test_validate_input_database_1	0	1.5 sec